Crea un account gratuito
Iscriviti a Calaméo per pubblicare e condividere documenti con tutti!
Inoltre: vota e commenta le tue pubblicazione preferite, scarica documenti e condividi le tue letture con gli amici.
EE Times Highlights Case Study of EM Emissions Scans of New Chip Features Used in Auto-Electronics
1 pagine
Pubblicato da
associate5
EE Times Highlights Case Study of EM Emissions Scans of New Chip Features Used in
Auto-Electronics
New EE Times article highlights very-near-field EM scanning technology.
The EMxpert
Scanner, produced by EMSCAN, delivers immediate...
[Di più]
EE Times Highlights Case Study of EM Emissions Scans of New Chip Features Used in
Auto-Electronics
New EE Times article highlights very-near-field EM scanning technology.
The EMxpert
Scanner, produced by EMSCAN, delivers immediate spatial and spectral
electromagnetic emission profiles.
The article includes two example case studies
included test results and images.
Calgary, Alberta, August 23, 2011 -- On August 11, 2011, EE Times posted a new
Design Article on the Automotive Design site that highlights electromagnetic
emission test results and images for two new chip features.
The imaging results,
provided courtesy of National Semiconductor, used very-near-field EM scanning
technology to generate the test results.
The technology, developed and marketed by
EMSCAN allows chip vendors (and other manufacturers of electronic devices) to
quantify and immediately display spatial and spectral electromagnetic emissions
profiles.
The two case studies featured in the article display before a
[Di meno]
Tag
article,
case,
chip,
design,
electromagnetic,
emissions,
emscan,
emxpert,
engineers,
features,
field,
highlights,
results,
scanning,
study,
technology,
test
